期刊
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
卷 142, 期 -, 页码 -出版社
ELSEVIER SCI LTD
DOI: 10.1016/j.mssp.2022.106466
关键词
Double perovskite; X-ray diffraction; Lattice parameters; Errors
This comment highlights severe errors in the crystallographic part of the commented paper, pointing out the need for corrections in the composition and symmetry of the studied crystals.
My comments concern the severe errors in the crystallographic part of the commented paper. The actual composition of the studied crystals is not known, but the diffraction patterns and Rietveld analysis suggest the chemical formula to be Ba2Sr(VO4)(FeO4) instead of BaSrFeVO6. Moreover, the symmetry should be trigonal.
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