期刊
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
卷 140, 期 -, 页码 -出版社
ELSEVIER SCI LTD
DOI: 10.1016/j.mssp.2021.106378
关键词
PbSe; Ligand removal; Ammonium sulfide; ZnO; Contact resistance; Band to band tunneling
类别
资金
- Basic Science Research Program through the National Research Foundation of Korea (NRF) - Ministry of Education [NRF-2015R1A6A1A03031833, NRF-2019R1F1A1060042, NRF-2020R1A2C1007258]
- Hongik Faculty Research Support Fund
The study quantified the ZnO/PbSe contact resistance for the first time and showed that treatment with ammonium sulfide can enhance interfacial charge transfer rate and decrease contact resistivity. The removal of ligands led to an increase in carrier concentration in the contact region, mitigating carrier depletion.
For the first time, we quantified the ZnO/lead sulfide (PbSe) contact resistance directly using a ZnO/PbSe/ZnO test platform, eliminating the additional interface associated with metal electrodes which complicate the direct analysis of the contact properties. We demonstrated that a significant enhancement of the interfacial charge transfer rate through the ligand removal process of the PbSe colloid quantum dots (CQDs) with ammonium sulfide ((NH4)(2)S) treatment results from the accumulation of mobile carriers. The ligand removal process dramatically decreased the contact resistivity from 1.0x10(3) (after 1,2-ethanedithiol (EDT)-treatment) to 7.9 Omega cm(2). A significant increase in the carrier concentration was observed in the ZnO/PbSe contact region as well as the PbSe CQD channel, mitigating carrier depletion at the contact. We propose that the ligand removal process led to thermally-activated hopping of carriers from the ZnO to the PbSe instead of trap-assisted tunneling in the EDT-treated PbSe CQDs.
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