MicroStructural Hierarchy Descriptor (μSHD)-property correlations of silicon carbide ceramics

A systematic and extensible framework for quantification of structural hierarchy is indispensable to understand the structure-property correlation of SiC ceramics. Microstructural hierarchy descriptor (mu SHD) is constructed and used to quantify experimental microstructures reported in the literature. Despite a variation nature of microstructures and the scatterness in measured properties, mu SHD-property correlations have been identified. The mu SHD curves with less hierarchical levels suggest a high strength, while more hierarchical levels are related to a high toughness. The mu SHD curve exhibiting a homogeneous distribution across all the scales and one exhibiting a gradual decrease from the smaller to larger scales can both stand for a high thermal conductivity. A quick drop from the smaller to larger scales on the mu SHD curve is a characteristic of a high electrical resistivity, and a reverse trend, showing a gradual increase from smaller to larger scales and maintaining larger mu SHDs at larger scales, characterizes a low resistivity.

Automated summary

A systematic and extensible framework for quantification of structural hierarchy is crucial for understanding the structure-property correlation of SiC ceramics. The microstructural hierarchy descriptor (mu SHD) can be used to identify correlations between properties and different hierarchical levels in the microstructure. Different levels of hierarchy in the microstructure can affect the mechanical strength, toughness, thermal conductivity, and electrical resistivity of SiC ceramics.