4.6 Article

Pulse Compression Characteristics of an Opposed-Electrode Nonlinear GaAs Photoconductive Semiconductor Switch at 2 μJ Excitation

期刊

IEEE ELECTRON DEVICE LETTERS
卷 43, 期 5, 页码 753-756

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/LED.2022.3158552

关键词

Gallium arsenide (GaAs); avalanche multiplication; electric-field screening; pulse compression

资金

  1. National Natural Science Foundational of China [51877177, 52007152]
  2. Shaanxi Provincial Education Department [21JP085, 21JP088, 19JC032]
  3. Youth Innovation Team of Shaanxi Universities
  4. Natural Science Basic Research Plan of Shaanxi Province [2021JZ-48, 2020JM-462]
  5. China Postdoctoral Science Foundation [2021M702639]
  6. State Key Laboratory of Pulsed Power Laser Technology [SKL2020KF01]

向作者/读者索取更多资源

The investigation of nonlinear transient characteristics of gallium arsenide (GaAs) photoconductive semiconductor switches (PCSS) is of great significance for its applications in pulsed power technology. In this study, the researchers employed a laser diode (LD) with an energy of 2 mu J to trigger the GaAs PCSS. They observed compressed pulse width and increased amplitude as the bias electric field increased. Numerical modeling revealed that these effects can be attributed to negative differential mobility (NDM) and electric-field screening (EFS). The compression of pulse width provides the potential for relieving heat accumulation and suppressing device failure for high-repetition-rate applications.
The investigation of nonlinear transient characteristics of gallium arsenide (GaAs) photoconductive semiconductor switches (PCSS) is of great significance for its applications in pulsed power technology. In this letter, the laser diode (LD) energy of 2 mu J is employed to trigger the opposed-electrode GaAs PCSS. The compressed pulse width and increased amplitude are obtained as the bias electric field increases from 6kV/cm to 34kV/cm. It is numerically modeled the transient electric field distribution along the photogenerated carriers' transport. Results reveal that pulse compression effect (PCE) can be attributed to the negative differential mobility (NDM) and electric-field screening (EFS) effect. The compression of pulse width on time scale provides a possibility to relieve the heat accumulation on time scale, and further to suppress the device failure for the potential high-repetition-rate applications.

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