4.5 Article

Heteroepitaxial α-Ga2O3 MOSFETs with a 2.3 kV breakdown voltage grown by halide vapor-phase epitaxy

期刊

APPLIED PHYSICS EXPRESS
卷 15, 期 7, 页码 -

出版社

IOP Publishing Ltd
DOI: 10.35848/1882-0786/ac7431

关键词

alpha-Ga2O3; breakdown; halide vapor-phase epitaxy; hetero-epitaxy; MOSFETs; contact resistance

资金

  1. National Research Foundation of Korea (NRF) - Ministry of Education [2018R1D1A1B07048429, 2021R1F1A1058006]
  2. IC Design Education Center, Korea
  3. National Research Foundation of Korea [2021R1F1A1058006, 2018R1D1A1B07048429] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)

向作者/读者索取更多资源

Heteroepitaxial alpha-Ga₂O₃ MOSFETs with a breakdown voltage of 2.3 kV were reported, and improved device performance was achieved through modified electrode structure and growth method.
Here, we report on heteroepitaxial alpha-Ga2O3 MOSFETs with a breakdown voltage (BV) of 2.3 kV at a specific on-resistance of 335 m omega cm(2). High-quality alpha-Ga2O3 layers were grown on a sapphire substrate via halide vapor-phase epitaxy (HVPE). A stack of Ti/Al/Ni/Au was used for the S/D electrode, exhibiting significantly reduced contact resistance as compared with a conventional Ti/Au stack. Consequently, the record BV and mobility of 20.4 cm(2) V-1 s(-1) were achieved. Moreover, a consistent critical field of 1 MV cm(-1) was obtained for variable L-GD. Our results are superior to recently reported heteroepitaxial alpha-/beta-Ga2O3 MOSFETs, which is promising toward HVPE alpha-Ga2O3 based power devices. (C) 2022 The Japan Society of Applied Physics

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