期刊
APPLIED OPTICS
卷 61, 期 10, 页码 2604-2609出版社
Optica Publishing Group
DOI: 10.1364/AO.452651
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资金
- National Natural Science Foundation of China [61775094, 62175078]
In this study, a diffraction grating based on a multilayer silicon nitride waveguide is proposed, which demonstrates high upward diffraction efficiency and large effective length. The analysis shows that the diffraction grating has a high tolerance to process variations and can adjust the near-field effective length. The research results suggest that this diffraction grating has potential applications in optical sensing and imaging.
Diffraction gratings with high upward diffraction efficiency and large effective length are required for chip-scale light detection and ranging. We propose a diffraction grating based on a multilayer silicon nitride waveguide, which theoretically achieves an upward diffraction efficiency of 92%, a near-field effective length of 376 mu m, and a far-field divergence angle of 0.105 degrees at a wavelength of 850 nm. The diffraction grating has a high tolerance to process variations based on Monte Carlo analysis. When the conditions are +/- 5% layer thickness variation, +/- 50 nm lithographic variation, and +/- 20 nm wavelength drift, more than 71% of the grating samples have a diffraction efficiency higher than 80%, and100% of the samples have an effective length larger than 200 mu m(corresponding to a far-field divergence <0.2 degrees). Furthermore, the near-field effective length of the grating with an upward diffraction efficiency above 90% can be adjusted from hundreds of microns to centimeters by changing the etching layer thickness and the grating duty cycle. This diffraction grating has a potential application in optical sensing and imaging from visible to near-IR wavelengths. (C) 2022 Optica Publishing Group
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