4.7 Review

Composition, thickness, and homogeneity of the coating of core-shell nanoparticles-possibilities, limits, and challenges of X-ray photoelectron spectroscopy

期刊

ANALYTICAL AND BIOANALYTICAL CHEMISTRY
卷 414, 期 15, 页码 4331-4345

出版社

SPRINGER HEIDELBERG
DOI: 10.1007/s00216-022-04057-9

关键词

X-ray spectroscopy (XPS/XRF/EDX); Nanoparticles/nanotechnology; Spectroscopy/instrumentation; Spectroscopy/theory

资金

  1. European Union through the European Metrology Programme for Innovation and Research (EMPIR) - EMPIR participating countries within EURAMET [17SIP03, 14IND12]
  2. [NMS/ST21]

向作者/读者索取更多资源

This review discusses the possibilities, limits, and challenges of using X-ray photoelectron spectroscopy (XPS) to study the composition, thickness, and homogeneity of nanoparticle coatings. Different approaches for calculating the coating thickness are presented, and the use of XPS background modeling and measuring with varying excitation energies or hard-energy X-ray sources are also discussed.
Core-shell nanoparticles have attracted much attention in recent years due to their unique properties and their increasing importance in many technological and consumer products. However, the chemistry of nanoparticles is still rarely investigated in comparison to their size and morphology. In this review, the possibilities, limits, and challenges of X-ray photoelectron spectroscopy (XPS) for obtaining more insights into the composition, thickness, and homogeneity of nanoparticle coatings are discussed with four examples: CdSe/CdS quantum dots with a thick coating and a small core; NaYF4-based upconverting nanoparticles with a large Yb-doped core and a thin Er-doped coating; and two types of polymer nanoparticles with a poly(tetrafluoroethylene) core with either a poly(methyl methacrylate) or polystyrene coating. Different approaches for calculating the thickness of the coating are presented, like a simple numerical modelling or a more complex simulation of the photoelectron peaks. Additionally, modelling of the XPS background for the investigation of coating is discussed. Furthermore, the new possibilities to measure with varying excitation energies or with hard-energy X-ray sources (hard-energy X-ray photoelectron spectroscopy) are described. A discussion about the sources of uncertainty for the determination of the thickness of the coating completes this review.

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