Energy-dispersive X-ray spectroscopy and atom-probe tomography data quantifying component-ratios of multicomponent nano-precipitates in ion-irradiated ceria

Samples of similar to 1 mu m films of CeO2 doped with 2 wt% Mo, 1.5 wt% Ru, 0.75 wt% Pd, 0.5 wt% Re and 0.25 wt% Rh grown with pulsed laser deposition were irradiated with I2+ ions (610 degrees C and 730 degrees C, 10(16) and 5 x 10(16) I2+/cm(2)). For selected samples post-irradiation heat treatment was conducted (900 degrees C, 1100 degrees C). The specimens were sectioned with focused ion beam milling and characterized in a transmission electron microscope with energy-dispersive x-ray spectroscopy, and with atom-probe tomography. Energy-dispersive x-ray spectroscopy was used to obtain elemental maps showing the distribution of dopants in the specimen after exposure. Some of these maps are discussed in detail in our companion article Formation of multicomponent alloy particles in doped ceria under I2+ ion irradiation and thermal annealing in the Journal of Nuclear Materials [1]. Advanced computational analysis could be used to more accurately quantify local compositions. Data is provided for additional regions of interest and one additional irradiation condition. The doped ceria film that was heat treated at 1100 degrees C delaminated from the substrate in most places. Samples were extracted from the underside of a delaminated piece and analyzed with atom-probe tomography. The resulting data show ceria and a Mo-rich particle and demonstrate that this approach is feasable in principle to study local compositions in a sample exposed to such extreme conditions.

Automated summary

The distribution of dopants in CeO2 films after I2+ ion irradiation and heat treatment was studied with advanced characterization techniques, showing the feasibility of using this approach to analyze local compositions in samples exposed to extreme conditions.