4.7 Article

Oxygen changes crack modes of Ni-based single crystal superalloy

期刊

MATERIALS RESEARCH LETTERS
卷 9, 期 12, 页码 531-539

出版社

TAYLOR & FRANCIS INC
DOI: 10.1080/21663831.2021.1993367

关键词

Ni-based superalloys; oxidation; environment-assisted cracking; in-situ transmission electron microscopy

资金

  1. Natural Science Foundation of China [91860202, 51988101, 52071003, 11604006]
  2. Beijing Municipal Education Commission Project [PXM2020_014204_000021]
  3. Beijing Outstanding Young Scientists Projects [BJJWZYJH01201910005018]
  4. China Postdoctoral Science Foundation [2020 M670073]
  5. Beijing Natural Science Foundation [Z180014]
  6. {111} project [DB18015]
  7. Australian Research Council [DP190102990]

向作者/读者索取更多资源

This study investigates the oxidation and fracture behaviors of a thin Ni-based single crystal superalloy component at 650 degrees C under stress using an in-situ thermal-stress environmental transmission electron microscope. It was found that in-situ oxidation changed the tensile fracture mode from plastic fracture on {111} planes to brittle fracture on {001} planes adjacent to the gamma/gamma interfaces. Microanalysis also revealed different oxidation behaviors of gamma ' cuboids, gamma phase, and gamma/gamma interface, highlighting the thickness debit effect.
Oxygen-affected cracking commonly presents on thin Ni-based single crystal superalloy components serving in high temperature and oxidizing environments. This study uses a newly developed in-situ thermal-stress environmental transmission electron microscope to investigate the oxidation and fracture behaviors of Ni-based single crystal superalloy at 650 degrees C under stress. The in-situ oxidation was found to change the tensile fracture mode from the close-packed {111} planes of plastic fracture to {001} planes adjacent to gamma/gamma ' interfaces of brittle fracture. The microanalysis also revealed that the gamma ' cuboids, gamma phase, and gamma/gamma interface exhibit different oxidation behavior, thus underscoring the thickness debit effect. [GRAPHICS] .

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