期刊
JOURNAL OF SYNCHROTRON RADIATION
卷 29, 期 -, 页码 230-238出版社
INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S1600577521011139
关键词
nanotomography; full-field X-ray microscopy; Zernike phase contrast; machine learning; denoising
资金
- Deutsche Forschungsgemeinschaft [192346071]
This article verifies the efficient application of self-supervised denoising machine learning technique in high-resolution nanotomography, which eliminates noise without blurring structural features, providing a powerful tool for quantitative analysis in various scientific fields.
High-resolution X-ray nanotomography is a quantitative tool for investigating specimens from a wide range of research areas. However, the quality of the reconstructed tomogram is often obscured by noise and therefore not suitable for automatic segmentation. Filtering methods are often required for a detailed quantitative analysis. However, most filters induce blurring in the reconstructed tomograms. Here, machine learning (ML) techniques offer a powerful alternative to conventional filtering methods. In this article, we verify that a self-supervised denoising ML technique can be used in a very efficient way for eliminating noise from nanotomography data. The technique presented is applied to high-resolution nanotomography data and compared to conventional filters, such as a median filter and a nonlocal means filter, optimized for tomographic data sets. The ML approach proves to be a very powerful tool that outperforms conventional filters by eliminating noise without blurring relevant structural features, thus enabling efficient quantitative analysis in different scientific fields.
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