期刊
PHYSICAL REVIEW APPLIED
卷 16, 期 5, 页码 -出版社
AMER PHYSICAL SOC
DOI: 10.1103/PhysRevApplied.16.054032
关键词
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资金
- U.S. Department of Energy (DOE) Quantum Information Science Enabled Discovery (QuantISED) program [DE-SC0019396]
- Army Research Laboratory Maryland-ARL Quantum Partner-ship (MAQP) program [W911NF-19-2-0181]
- Defense Advanced Research Projects Agency (DARPA) Driven and Nonequilibrium Quantum Sys-tems (DRINQS) program [D18AC00033]
- University of Maryland Quantum Technology Center
- National Sci-ence Foundation [1541959]
- Center for Novel Pathways to Quantum Coherence in Materials, an Energy Frontier Research Center - U.S. Department of Energy, Office of Science, Basic Energy Sciences
- U.S. Department of Energy, Office of Science, National Quantum Information Science Research Centers
- U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences [DE-AC02-06CH11357]
- U.S. Department of Energy (DOE) [DE-SC0019396] Funding Source: U.S. Department of Energy (DOE)
Understanding nano- and microscale crystal strain in chemical-vapor-deposition diamond is crucial for diamond quantum technologies. Quantitative measurement of crystal deformation in diamond with high spatial and strain resolution is achieved using nanofocused scanning x-ray diffraction microscopy, allowing for stereoscopic three-dimensional modeling of strain-feature geometry. These results provide both strain and spatial resolution sufficient for directional detection of dark matter and offer a promising tool for diamond growth analysis and improvement of defect-based sensing.
An understanding of nano- and microscale crystal strain in chemical-vapor-deposition diamond is crucial to the advancement of diamond quantum technologies. In particular, the presence of such strain and its characterization presents a challenge to diamond-based quantum sensing and information applications-as well as for future dark-matter detectors, where the directional information about incoming particles is encoded in crystal strain. Here, we exploit nanofocused scanning x-ray diffraction microscopy to quantitatively measure crystal deformation from defects in diamond with high spatial and strain resolution. The combination of information from multiple Bragg angles allows stereoscopic three-dimensional modeling of strain-feature geometry; the diffraction results are validated via comparison to optical measurements of the strain tensor based on spin-state-dependent spectroscopy of ensembles of nitrogen-vacancy centers in the diamond. Our results demonstrate both strain and spatial resolution sufficient for directional detection of dark matter via x-ray measurement of crystal strain and provide a promising tool for diamond growth analysis and improvement of defect-based sensing.
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