期刊
NANOMATERIALS
卷 12, 期 1, 页码 -出版社
MDPI
DOI: 10.3390/nano12010082
关键词
nanoindentation; chromium (III) oxide; atomic layer deposition; hardness; elastic modulus
类别
资金
- European Regional Development Fund [TK134]
- Estonian Research Agency [PRG753, PRG4]
In this study, Cr2O3 thin films with different structures were deposited using atomic layer deposition, and their phase composition, hardness, and other properties were measured. The results indicate that Cr2O3 could be a promising material as a mechanically protective thin film.
Chromium (III) oxide is a technologically interesting material with attractive chemical, catalytic, magnetic and mechanical properties. It can be produced by different chemical and physical methods, for instance, by metal-organic chemical vapor deposition, thermal decomposition of chromium nitrate Cr(NO3)(3) or ammonium dichromate (NH4)(2)Cr2O7, magnetron sputtering and atomic layer deposition. The latter method was used in the current work to deposit Cr2O3 thin films with thicknesses from 28 to 400 nm at deposition temperatures from 330 to 465 degrees C. The phase composition, crystallite size, hardness and modulus of elasticity were measured. The deposited Cr2O3 thin films had different structures from X-ray amorphous to crystalline alpha-Cr2O3 (eskolaite) structures. The averaged hardness of the films on SiO2 glass substrate varied from 12 to 22 GPa and the moduli were in the range of 76-180 GPa, as determined by nanoindentation. Lower values included some influence from a softer deposition substrate. The results indicate that Cr2O3 could be a promising material as a mechanically protective thin film applicable, for instance, in micro-electromechanical devices.
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