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Serial Block-Face Scanning Electron Microscopy (SBEM) for the Study of Dendritic Spines

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JOURNAL OF VISUALIZED EXPERIMENTS
DOI: 10.3791/62712

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  1. National Science Centre (Poland) [UMO-2018/31/B/NZ4/01603]

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3D electron microscopy offers nanoscale resolution for analyzing morphological parameters of dendritic spines, with features such as spine volume and PSD only observable with this technique. SBEM provides easier and more reproducible 3D EM data, while also reducing the number of animals needed for experimentation.
Three-dimensional electron microscopy (3D EM) gives a possibility to analyze morphological parameters of dendritic spines with nanoscale resolution. In addition, some features of dendritic spines, such as volume of the spine and postsynaptic density (PSD) (representing post-synaptic part of the synapse), presence of presynaptic terminal, and smooth endoplasmic reticulum or atypical form of PSD (e.g., multi-innervated spines), can be observed only with 3D EM. By employing serial blockface scanning electron microscopy (SBEM) it is possible to obtain 3D EM data easier and in a more reproducible manner than when performing traditional serial sectioning. Here we show how to prepare mouse hippocampal samples for SBEM analysis and how this protocol can be combined with immunofluorescence study of dendritic spines. Mild fixation perfusion allows us to perform immunofluorescence studies with light microscopy on one half of the brain, while the other half was prepared for SBEM. This approach reduces the number of animals to be used for the study.

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