Embedding Cs3Cu2I5 Scintillators into Anodic Aluminum Oxide Matrix for High-Resolution X-Ray Imaging

Scintillators are widely utilized as X-ray imaging detectors. Pixelated scintillator films with optical-waveguide-effect are preferred to realize high-resolution X-ray imaging. However, it remains a great challenge to rapidly fabricate high-resolution pixelated scintillator film. Herein, a new strategy is developed to solve the problem by embedding metal halide scintillators into an anodic aluminum oxide (AAO) via a facile hot-pressing method. Cs3Cu2I5 is selected as the prototype to fabricate pixelated scintillator films with targeted thickness, denoted as Cs3Cu2I5-AAO. The light confinement effect provided by AAO is validated by finite-difference time-domain simulations. In particular, the as-prepared Cs3Cu2I5-AAO film demonstrates higher spatial resolution (10.4 lp mm(-1) at modulation transfer function = 0.2), higher UV and X-ray imaging performances compared to the homogeneous counterpart and commercialized terbium-doped gadolinium oxysulfide. These results can inspire further research on the design of nanostructured metal halide perovskites for high-resolution X-ray imaging.

Automated summary

A new strategy of embedding metal halide scintillators into anodic aluminum oxide (AAO) has been developed, resulting in high-resolution pixelated scintillator films such as Cs3Cu2I5-AAO with excellent imaging performance. This approach offers a new pathway for high-resolution X-ray imaging.