期刊
MATERIALS
卷 14, 期 24, 页码 -出版社
MDPI
DOI: 10.3390/ma14247576
关键词
pulsed laser deposition; pulsed laser annealing; zinc oxide; lutetium oxide; titanium oxide; europium; in situ monitoring; photoluminescence
This study focuses on utilizing pulsed laser techniques to prepare Eu3+-doped oxide thin films, adjusting their properties through pulsed UV laser annealing in order to maximize Eu3+ photoluminescent response. The optical, structural, and surface properties were characterized using X-ray diffraction and atomic force microscopy to understand the changes induced by the annealing process.
Eu3+-doped oxide thin films possess a great potential for several emerging applications in optics, optoelectronics, and sensors. The applications demand maximizing Eu3+ photoluminescence response. Eu-doped ZnO, TiO2, and Lu2O3 thin films were deposited by Pulsed Laser Deposition (PLD). Pulsed UV Laser Annealing (PLA) was utilized to modify the properties of the films. In situ monitoring of the evolution of optical properties (photoluminescence and transmittance) at PLA was realized to optimize efficiently PLA conditions. The changes in optical properties were related to structural, microstructural, and surface properties characterized by X-ray diffraction (XRD) and atomic force microscopy (AFM). The substantial increase of Eu3+ emission was observed for all annealed materials. PLA induces crystallization of TiO2 and Lu2O3 amorphous matrix, while in the case of already nanocrystalline ZnO, rather surface smoothening0related grains' coalescence was observed.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据