Surface structure characterization of a (√5 x √5)-R26.6° reconstruction of strontium titanate (001) by X-ray photoelectron diffraction

The surface composition of a (root 5 x root 5)-R26.6 degrees (Rt5) reconstruction of a strontium titanate (001) single crystal surface was characterized by X-ray photoelectron spectroscopy (XPS), and its atomic surface structure was determined by a combination of low energy electron diffraction (LEED) and X-ray photoelectron diffraction (XPD). The comparison between experimental and theoretical XPD results involving multiple scattering calculations indicated that the analyzed Rt5 reconstruction of the SrTiO3 (001) surface has two possible terminations: 40% of SrO and 60% of TiO2.

Automated summary

The surface composition of a (root 5 x root 5)-R26.6 degrees reconstruction of a strontium titanate (001) single crystal was characterized by X-ray photoelectron spectroscopy, while its atomic surface structure was determined by a combination of low energy electron diffraction and X-ray photoelectron diffraction. Experimental and theoretical XPD results suggested that the surface reconstruction has two possible terminations: 40% SrO and 60% TiO2.