4.3 Article

Computational study of group III-V semiconductors and their interaction with oxide thin films

期刊

SOLID-STATE ELECTRONICS
卷 184, 期 -, 页码 -

出版社

PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.sse.2021.108038

关键词

III-V semiconductors; DFT calculations; Heterojunctions; Thin films; TiO2

资金

  1. Italian Ministry of University and Research (MIUR) through the PRIN Project [20179337R7]
  2. grant Dipartimenti di Eccellenza - 2017 Materials For Energy
  3. COST (European Cooperation in Science and Technology) [18234]

向作者/读者索取更多资源

The study shows that the interface formed by indium phosphide and titania thin films is stabilized by In-O and Ti-P chemical bonds, resulting in a staggered type-II heterojunction which has significant implications for photocatalysis.
We present a hybrid density-functional study of indium phosphide coated with titania subnanometric films. We modelled the InP phase with a 2.4 nm thick (110) slab, and studied the junctions formed with thin films of (101) and (001) anatase TiO2. In both cases, the interface is stabilized by In-O and Ti-P chemical bonds. By analysing the band edges alignment, one can see that in both cases a staggered type-II heterojunction is formed, with important implications for photocatalysis.

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