Structural properties of Ge-Sb-Te alloys

In this work, we have investigated the structural properties of Germanium (Ge)-Antimony (Sb)-Tellurium (Te) (GST) and Ge-rich GST thin film samples. The structural properties of the films are studied after annealing temperatures from room temperature to 450 degrees C. We performed the annealing procedure using a heat rate of 10 degrees C/min to achieve the target temperature for a duration of 10 min under N2 flow. After heat treatment, we carried out X-Ray Diffraction (XRD), Fourier Infra-Red Spectroscopy (FTIR), Raman Spectroscopy and Scanning Electron Microscopy (SEM) equipped with Energy-dispersive X-ray spectroscopy (EDS) to investigate the evolution of the structure in the samples.

Automated summary

The structural properties of Germanium-Antimony-Tellurium (GST) and Ge-rich GST thin film samples were investigated in this work. The films were studied after annealing at various temperatures, and analysis techniques such as X-Ray Diffraction, FTIR, Raman Spectroscopy, and SEM equipped with EDS were used to study the evolution of the structure in the samples.