相关参考文献
注意：仅列出部分参考文献，下载原文获取全部文献信息。Back to the Future: Digital Circuit Design in the FinFET Era
Xinfei Guo et al.
JOURNAL OF LOW POWER ELECTRONICS (2017)
Performance and Device Design Based on Geometry and Process Considerations for 14/16-nm Strained FinFETs
Fazliyatul Azwa Md Rezali et al.
IEEE TRANSACTIONS ON ELECTRON DEVICES (2016)
Electrical Characteristics of 8-nm SOI n-FinFETs
N. Boukortt et al.
SILICON (2016)
Electrical characteristic fluctuation of 16-nm-gate trapezoidal bulk FinFET devices with fixed top-fin width induced by random discrete dopants
Wen-Tsung Huang et al.
NANOSCALE RESEARCH LETTERS (2015)
Fin Shape Impact on FinFET Leakage With Application to Multithreshold and Ultralow-Leakage FinFET Design
Brad D. Gaynor et al.
IEEE TRANSACTIONS ON ELECTRON DEVICES (2014)
Matching Performance of FinFET Devices With Fin Widths Down to 10 nm
P. Magnone et al.
IEEE ELECTRON DEVICE LETTERS (2009)
分享论文
