期刊
OPTICS COMMUNICATIONS
卷 498, 期 -, 页码 -出版社
ELSEVIER
DOI: 10.1016/j.optcom.2021.127245
关键词
Electronic speckle pattern interferometry; Optical metrology; Phase shifting; In-plane displacement; interferometry
类别
资金
- National Council of Science and Technology (CONACYT), Mexico [A1S20925]
- Universidad Tecnologica de Tulancingo, Mexico [30562/Proy. A1S20925]
- Consejo Nacional de Ciencia y Tecnologia (CONACYT), Mexico
This study proposes combining electronic speckle pattern interferometry with polarizing phase-shifting techniques to measure in-plane displacement fields, and demonstrates the effectiveness of the proposal through experimental validation.
We propose to combine electronic speckle pattern interferometry with polarizing phase-shifting techniques to measure in-plane displacement fields. We present the technical and theoretical procedures for its implementa-tion, added with the necessary calibration procedures employing a commercial polarimeter. Finally, we tested our proposal experimentally using a two-phase step algorithm to measure in-plane displacements on a latex sample.
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