Influence of shunt capacitance on impact load measurement of polyvinylidene fluoride sensor

Shunt capacitance is one of the most critical parts of the test circuit in charge mode, and its influence on impact load measurement of polyvinylidene fluoride (PVDF) is worth discussing. In this study, several experiments are conducted by connecting different shunt capacitances. The results show that in addition to the shunt capacitor, the charge generated is partially concentrated on the PVDF capacitor and extra capacitor, and the amount depends on the capacitance ratio. The source of the extra capacitance is the test circuit parasitic capacitance and the PVDF capacitance change during the impact load, and their influence must be minimized due to difficulty to measure or calculate. Therefore, based on the measurement principles, the interference caused by the extra capacitance in the charge and current modes is analyzed, and suitable measurement conditions are compared. Research in this paper is helpful to improve the accuracy of impact load measurement with PVDF.

Automated summary

Shunt capacitance plays a crucial role in the test circuit for charge mode, and its impact on polyvinylidene fluoride (PVDF) impact load measurement is worth discussing. This study conducts experiments by connecting different shunt capacitances and finds that the charge generated not only concentrates on the shunt capacitor, but also on the PVDF capacitor and extra capacitor, depending on the capacitance ratio. The extra capacitance is caused by the parasitic capacitance of the test circuit and the change in PVDF capacitance during impact load, and minimizing their influence is challenging. By analyzing the interference caused by the extra capacitance and comparing suitable measurement conditions, the research in this paper aims to improve the accuracy of PVDF impact load measurement.