Development on measurement method for Thomson coefficient of thin film

It is in general difficult to accurately measure the Thomson coefficient of a thin film owing to the heat transfer through the substrate. Therefore, we propose a new method to measure the Thomson coefficient of a metallic thin film. The Thomson coefficient of a metallic film on a substrate can be measured by using an AC-DC method that has been developed for the precise measurement of the Thomson coefficient of a metallic bulk sample. In the AC-DC method, there is no need to estimate the heat conductance of the substrate, i.e., the heat loss of the thin film. The AC-DC method allows us to determine the Thomson coefficient without the value of the thermal conductivity of the thin film. We report the measured Thomson coefficient of a platinum film on a glass substrate.

Automated summary

The study proposes a new method to measure the Thomson coefficient of a metallic thin film without estimating the heat conductance of the substrate. The AC-DC method allows for precise measurement of the Thomson coefficient on the film without the need for the thermal conductivity value.