期刊
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING
卷 137, 期 -, 页码 -出版社
ELSEVIER SCI LTD
DOI: 10.1016/j.mssp.2021.106217
关键词
Passivated emitter rear contact (PERC) cell; Supercritical fluid(SCF) technique; Solar cell; Al2O3; Passivation layer
类别
资金
- Bureau of Energy Grant [110-D0104]
- Ministry of Science and Technology, Taiwan, R.O. C. [MOST-109-2112-M-110-015-MY3, MOST-108-2923-M-110-005-MY3]
The use of supercritical fluid as a low temperature defect passivation technology to enhance PERC solar cell performance was investigated in this study. Electronic analysis confirmed the benefits of the SCF treatment on solar cell properties. A proposed model explained how the SCF treatment passivates interface defects and improves device performance.
Improving material and interface defects are an important issue in reducing solar cell leakage current and enhancing their efficiency. From back surface field (BSF)-based solar cell to passivated emitter and rear cell (PERC), solar cell structures have been designed to reduce defects. In this study, a supercritical fluid (SCF) technique is applied as a low temperature defect passivation technology to passivate defects in a PERC solar cell, enhancing device performance. Owing to the high penetration and high solubility of the supercritical fluid, hydrogen is the passivation source carried into the device to passivate Al2O3/Si interface defects. Furthermore, electronic analysis is used to confirm the benefits of the SCF treatment on the solar cell properties of open-circuit voltage (Voc), short-circuit current (Jsc), fill factor (FF), efficiency, power (Pmax) and series resistance (Rs), all measured under a standard light source. Finally, a model is proposed to explain how the SCF treatment passivates interface defects and enhances device performance.
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