期刊
JOURNAL OF PHYSICS D-APPLIED PHYSICS
卷 55, 期 16, 页码 -出版社
IOP Publishing Ltd
DOI: 10.1088/1361-6463/ac3f59
关键词
substrate temperature; crystal structure; magnetic anisotropy; resonance frequency
资金
- National Natural Science Foundation of China [11904056]
- Guangzhou Basic and Applied Basic Research Project [202102020053]
- Open Project of Key Laboratory for Magnetism and Magnetic Materials of the Ministry of Education, Lanzhou University [LZUMMM2021001]
This study investigates the correlation between the structure and magnetic properties of FeSi films deposited at different substrate temperatures. The results demonstrate the possibility of preparing soft films with deterministic magnetic anisotropy for practical applications.
FeSi films with different substrate temperature (T (s)) were deposited on MgO(001) substrates by radiofrequency magnetron sputtering. During the change of crystal structure from the amorphous to the epitaxial state, the magnetic anisotropy changed in three stages: dominant uniaxial magnetic anisotropy (T (s) < 400 degrees C), enhanced cubic magnetocrystalline anisotropy (400 degrees C <= T (s)<= 600 degrees C) and weak cubic magnetocrystalline anisotropy (T (s) = 700 degrees C and 800 degrees C). In addition, the resonance frequency integral (r) first decreased and then reached its maximum value before finally disappearing due to the large coercivity field. These results demonstrate the correlation between the structure and static and dynamic magnetic properties of FeSi films, and provide an effective method for preparing soft films with deterministic uniaxial or cubic magnetic anisotropy for practical applications.
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