期刊
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS
卷 160, 期 -, 页码 -出版社
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.jpcs.2021.110309
关键词
Titanium dichalcogenides; Photoelectron spectroscopy; Structural fragments; Photoelectron microscopy; Electronic structure
资金
- Ministry of Education and Science of Russia [AAAAA18-118020290104-2, AAAA-A18118020190098-5]
- RFBR [19-33-60031]
- EU-H2020 research and innovation program [654360]
The morphology of heterogeneous CrxTi1-xSe2 and CrxTi1-xS2 single crystals was studied using X-ray scanning photoemission microscopy (SPEM) and angular resolved photoemission spectroscopy (ARPES). The formation of structural fragments inside CrxTi1-xSe2 single crystals was confirmed to depend on the chalcogen (S, Se) forming the crystal lattice.
The morphology of the heterogeneous CrxTi1-xSe2 and CrxTi1-xS2 single crystals has been studied using X-ray scanning photoemission microscopy (SPEM) and angular resolved photoemission spectroscopy (ARPES). A direct method of SPEM provided us the insight into the origin of the blurred ARPES images for Cr0.78Ti0.36Se2 single crystal. Using SPEM, we confirmed the formation of the CrSe2-based structural fragments inside the CrxTi1-xSe2 single crystals with x >= 0.75. The chemical composition of the forming structural fragments depends on the chalcogen (S, Se) forming the crystal lattice.
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