4.5 Article

Multi-principal element grain boundaries: Stabilizing nanocrystalline grains with thick amorphous complexions

期刊

JOURNAL OF MATERIALS RESEARCH
卷 37, 期 2, 页码 554-566

出版社

SPRINGER HEIDELBERG
DOI: 10.1557/s43578-021-00459-0

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资金

  1. US Department of Energy, Office of Basic Energy Sciences, Materials Science and Engineering Division [DE-SC0021224]
  2. National Science Foundation Center for Chemistry at the Space-Time Limit [CHE-0802913]
  3. U.S. Department of Energy (DOE) [DE-SC0021224] Funding Source: U.S. Department of Energy (DOE)

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It has been demonstrated that increasing the chemical complexity of grain boundaries can enhance the ductility and stability of nanocrystalline alloys. In this study, significant boundary segregation was observed in the Cu-Zr-Hf-Nb-Ti alloy, resulting in a thicker amorphous complexion and high thermal stability. The complex grain boundary chemistry and multi-component segregation contributed to the thicker amorphous complexion and the enhanced stability.
Amorphous complexions have recently been demonstrated to simultaneously enhance the ductility and stability of certain nanocrystalline alloys. In this study, three quinary alloys (Cu-Zr-Hf-Mo-Nb, Cu-Zr-Hf-Nb-Ti, and Cu-Zr-Hf-Mo-W) are studied to test the hypothesis that increasing the chemical complexity of the grain boundaries will result in thicker amorphous complexions and further stabilize a nanocrystalline microstructure. Significant boundary segregation of Zr, Nb, and Ti is observed in the Cu-Zr-Hf-Nb-Ti alloy, which creates a quaternary interfacial composition that limits average grain size to 63 nm even after 1 week at similar to 97% of the melting temperature. This high level of thermal stability is attributed to the complex grain boundary chemistry and amorphous structure resulting from multi-component segregation. High-resolution transmission electron microscopy reveals that the increased chemical complexity of the grain boundary region in the Cu-Zr-Hf-Nb-Ti alloy results in an average amorphous complexion thickness of 2.44 nm, approximately 44% and 32% thicker than amorphous complexions previously observed in Cu-Zr and Cu-Zr-Hf alloys.

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