4.7 Article

Modulation Linearity Characterization of Si Ring Modulators

期刊

JOURNAL OF LIGHTWAVE TECHNOLOGY
卷 39, 期 24, 页码 7842-7849

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JLT.2021.3093463

关键词

Silicon; Linearity; Modulation; Nonlinear optics; Voltage measurement; Optical filters; Optical modulation; Microwave photonics; modulation linearity; Si ring modulator

资金

  1. National Research Foundation of Korea (NRF) - Korea government (MSIT) [NRF-2020R1A2C2015089]

向作者/读者索取更多资源

The modulation linearity of Si ring modulators (RMs) was investigated using numerical simulation and experimental verification based on coupled-mode theory. The numerical values of key parameters were experimentally extracted and the simulation and measurement results showed good agreement. The study characterized the influence of input optical wavelength and power on the Si RM linearity.
Modulation linearity of Si ring modulators (RMs) is investigated through the numerical simulation based on the coupled-mode theory and experimental verification. Numerical values of the key parameters needed for the simulation are experimentally extracted. Simulation and measurement results agree well. With these, the influence of input optical wavelength and power on the Si RM linearity are characterized.

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