期刊
JOURNAL OF CRYSTAL GROWTH
卷 574, 期 -, 页码 -出版社
ELSEVIER
DOI: 10.1016/j.jcrysgro.2021.126335
关键词
Crystal structure; Defects; Liquid phase epitaxy; Semiconducting III-V materials; Semiconducting ternary compounds; Solar cells
资金
- European Regional Development Fund within the Operational Program Science and Education for Smart Growth 2014 -2020 under the Project CoE National center of mechatronics and clean technologies [BG05M2OP001-1.001-0008]
- Bulgarian Ministry of Education and Science under the National Research Program E+: Low Carbon Energy for the Transport and Households [D01-214/2018]
This paper presents an original study on the growth of metamorphic GaAsSb layers on GaAs substrates by liquid phase epitaxy (LPE) for photovoltaic applications. Various measurement methods were used to investigate the crystal structure, composition, surface morphology, and optical and electrical properties of the grown layers. The results demonstrate the potential of obtaining layers with specific compositions and properties for photovoltaic applications by carefully selecting the technological conditions.
In this paper, we present an original study on metamorphic GaAsSb layers grown by liquid phase epitaxy (LPE) on GaAs substrates for photovoltaic applications. To ensure a controlled growth of the layers with reproducible composition and properties a low-temperature (below 600 degrees C) variant of LPE was used combined with a precise choice of the technological conditions. This allowed obtaining layers with similar to 8% Sb in the As sublattice. The crystal structure, composition, surface morphology, local arrangement and chemical bonding of Sb in the obtained layers were investigated by a variety of measurement methods including X-ray diffraction, scanning electron microscopy, energy-dispersive X-ray spectroscopy, atomic force microscopy, X-ray photoelectron spectroscopy and Raman spectroscopy. Hall-effect measurements were performed in the temperature range of 80-300 K to clarify the influence of defects on the transport properties. Temperature-dependent photoluminescence spectra at low excitation power were measured to evaluate the optical quality and identify localized states in the grown layers. The optical absorption properties and the transport of the photogenerated carriers in the grown samples were investigated using surface photovoltage (SPV) spectroscopy at room temperature. The SPV measurements have shown that the long-wavelength photosensitivity of the GaAsSb layers is extended down to 1.2 eV.
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