4.6 Article

Impurity-hydrogen complexes in β-Ga2O3: Hydrogenation of shallow donors vs deep acceptors

期刊

JOURNAL OF APPLIED PHYSICS
卷 131, 期 3, 页码 -

出版社

AIP Publishing
DOI: 10.1063/5.0080341

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资金

  1. NSF [2019035, DMR 1856662, DMR 1901563]
  2. NSF REU site grant
  3. Office of Naval Research
  4. Department of the Defense, Defense Threat Reduction Agency [HDTRA1-20-2-0002]

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This article compares and contrasts the vibrational properties of complexes that involve shallow donors and deep acceptors, and presents theoretical analysis results.
Substitutional impurities in beta-Ga2O3 are used to make the material n-type or semi-insulating. Several O-H and O-D vibrational lines for complexes that involve impurities that are shallow donors and deep acceptors have been reported recently. The present article compares and contrasts the vibrational properties of complexes that involve shallow donors (OD-Si and OD-Ge) with complexes that involve deep acceptors (OD-Fe and OD-Mg). Theoretical analysis suggests that these results arise from defect complexes based on a shifted configuration of the Ga(1) vacancy with a trapped H atom and a nearby impurity.

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