相关参考文献
注意:仅列出部分参考文献,下载原文获取全部文献信息。Rational Engineering of the Dielectric Properties of Thin Silica Layers with a Single Plane of AgNPs
C. Rigoudy et al.
PROCEEDINGS OF THE 2020 3RD IEEE INTERNATIONAL CONFERENCE ON DIELECTRICS (ICD 2020) (2020)
Atmospheric operation of original electron emission device and generation of reactive species
Tadashi Iwamatsu et al.
APPLIED PHYSICS LETTERS (2019)
Experimental Investigation of Surface Potentials of Materials Under Electron Spectra Representative of GEO and MEO Worst Case Environments
J. -C. Mateo-Velez et al.
IEEE TRANSACTIONS ON PLASMA SCIENCE (2019)
Predictive modelling of the dielectric response of plasmonic substrates: application to the interpretation of ellipsometric spectra
A. Pugliara et al.
MATERIALS RESEARCH EXPRESS (2018)
Realistic Worst Case for a Severe Space Weather Event Driven by a Fast Solar Wind Stream
Richard B. Horne et al.
SPACE WEATHER-THE INTERNATIONAL JOURNAL OF RESEARCH AND APPLICATIONS (2018)
Charge injection in thin dielectric layers by atomic force microscopy: influence of geometry and material work function of the AFM tip on the injection process
C. Villeneuve-Faure et al.
NANOTECHNOLOGY (2016)
Investigation of the electron emission properties of silver: From exposed to ambient atmosphere Ag surface to ion-cleaned Ag surface
T. Gineste et al.
APPLIED SURFACE SCIENCE (2015)
Charging Properties of Space Used Dielectric Materials
Thierry Paulmier et al.
IEEE TRANSACTIONS ON PLASMA SCIENCE (2015)
Modified Bethe formula for low-energy electron stopping power without fitting parameters
Hieu T. Nguyen-Truong
ULTRAMICROSCOPY (2015)
Controlled elaboration of large-area plasmonic substrates by plasma process
A. Pugliara et al.
MATERIALS RESEARCH EXPRESS (2015)
Mean escape depth of secondary electrons emitted from semiconductors and insulators
A. G. Xie et al.
INDIAN JOURNAL OF PHYSICS (2013)
Dielectric Layers for RF-MEMS Switches: Design and Study of Appropriate Structures Preventing Electrostatic Charging
K. Makasheva et al.
IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION (2012)
Measurement Methods of Electron Emission Over a Full Range of Sample Charging
Ryan Hoffmann et al.
IEEE TRANSACTIONS ON PLASMA SCIENCE (2012)
Secondary Electron Emission on Space Materials: Evaluation of the Total Secondary Electron Yield From Surface Potential Measurements
N. Balcon et al.
IEEE TRANSACTIONS ON PLASMA SCIENCE (2012)
Note: Measuring effects of Ar-ion cleaning on the secondary electron yield of copper due to electron impact
Hai-Bo Zhang et al.
REVIEW OF SCIENTIFIC INSTRUMENTS (2012)
Calculated influence of work function on SE escape probability and Secondary Electron Emission yield
Jacques Cazaux
APPLIED SURFACE SCIENCE (2010)
Experimental investigation of the effect of the internal space charge accumulation on the electron emission yield of insulators submitted to e-irradiation: application to polycrystalline MgO
M. Belhaj et al.
JOURNAL OF PHYSICS D-APPLIED PHYSICS (2009)
Ignition of microcathode sustained discharge
K. Makasheva et al.
IEEE TRANSACTIONS ON PLASMA SCIENCE (2008)
CASINO V2.42 - A fast and easy-to-use modeling tool for scanning electron microscopy and microanalysis users
Dominique Drouin et al.
SCANNING (2007)
Electron beam charging of insulators: A self-consistent flight-drift model
M. Touzin et al.
JOURNAL OF APPLIED PHYSICS (2006)
A new examination of secondary electron yield data
YH Lin et al.
SURFACE AND INTERFACE ANALYSIS (2005)
Secondary electron contrast in low-vacuum/environmental scanning electron microscopy of dielectrics
BL Thiel et al.
JOURNAL OF APPLIED PHYSICS (2005)
Scenario for time evolution of insulator charging under various focused electron irradiations
J Cazaux
JOURNAL OF APPLIED PHYSICS (2004)
High dielectric constant oxides
J Robertson
EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS (2004)
Charging in scanning electron microscopy from inside and outside
J Cazaux
SCANNING (2004)
Secondary electron emission and self-consistent charge transport and storage in bulk insulators:: Application to alumina
X Meyza et al.
JOURNAL OF APPLIED PHYSICS (2003)
Secondary electron emission from dielectric materials of a Hall thruster with segmented electrodes
A Dunaevsky et al.
PHYSICS OF PLASMAS (2003)
Double- to single-hump shape change of secondary electron emission curve for thermal SiO2 layers
SG Yu et al.
APPLIED PHYSICS LETTERS (2001)
Study of the secondary-electron emission from thermally grown SiO2 films on Si
WK Yi et al.
THIN SOLID FILMS (2001)
Self-consistent electrical charging of insulating layers and metal-insulator-semiconductor structures
IA Glavatskikh et al.
JOURNAL OF APPLIED PHYSICS (2001)