Characterization of epitaxial CVD graphene on Ir(111)/α-Al2O3(0001) by photoelectron momentum microscopy

We characterized CVD-grown graphene with high single-crystallinity on Ir(111)/alpha-Al2O3(0001) by photoelectron momentum microscopy. A multi-functional photoelectron momentum microscope (PMM), which is installed with element-specific valence band photoelectron spectroscopy and X-ray absorption spectroscopy, is a complementary characterization tool to conventional methods, such as Raman spectroscopy and atomic force microscopy, for comprehensive and quantitative characterization of graphene/Ir(111). Using PMM, we characterized the properties of CVD-grown graphene including the single-crystallinity, number of layers, crystal orientation, and degree of interaction between graphene and Ir(111) and clarified the relationship between these properties and the CVD growth conditions.

Automated summary

This study characterized CVD-grown graphene on Ir(111)/alpha-Al2O3(0001) using photoelectron momentum microscopy and provided comprehensive insights into the properties of graphene, including its single-crystallinity, number of layers, crystal orientation, and interaction with the substrate, and their correlation with CVD growth conditions.