期刊
IEEE TRANSACTIONS ON RELIABILITY
卷 65, 期 1, 页码 459-468出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TR.2015.2435774
关键词
Bonferroni's inequality; Brownian motion process; cumulative exposure model; gamma process; geometric Brownian motion process; inverse Gaussian distribution
类别
资金
- Ministry of Science and Technology, Taiwan [MOST 103-2221-E-032-054]
An accelerated degradation test (ADT) can be used to assess the reliability of highly reliable products by using degradation information. In this study, to exhibit a monotone increasing pattern, the gamma process is used to model the degradation of a product subject to a constant-stress ADT of two loadings. Maximum likelihood estimates (MLEs) of the parameters of the ADT model were obtained. Given a budget for the total cost, an optimal ADT procedure was established to minimize the asymptotic variance of the MLE of the mean time to failure of a product, and the sample size and termination time of each run of the ADT at a constant measurement frequency were determined. An algorithm is provided to achieve an optimal ADT plan. An extensive Monte Carlo simulation was implemented to evaluate the sensitivity of the MLE variations to the sample size. A lumen degradation data set of light emitting diodes is presented to illustrate the proposed method.
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