期刊
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
卷 69, 期 5, 页码 1105-1119出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TNS.2022.3147143
关键词
MODFETs; HEMTs; Wide band gap semiconductors; Aluminum gallium nitride; Radiation effects; Protons; Impurities; 1; f noise; defects; gallium nitride; high electron mobility transistors (HEMTs); hydrogen; radiation effects
资金
- Air Force Office of Scientific Research
- Air Force Research Laboratory through the Hi-REV Program
- U.S. Air Force through the Radiation Effects Center of Excellence
An overview is presented of the effects of displacement damage, total-ionizing dose, and single-event effects in AlGaN/GaN HEMTs. High-fluence proton-induced displacement damage creates defects in the crystal structure. The response of DD/TID is strongly affected by the bias applied during irradiation. GaN-based HEMTs are particularly vulnerable to single-event effects, especially single-event burnout. Significant device-to-device variations in single-event burnout response exist in space systems.
An overview is presented of displacement damage (DD) effects, total-ionizing-dose (TID) effects, and single-event effects in AlGaN/GaN high electron mobility transistors (HEMTs). High-fluence proton-induced DD creates point defects and impurity complexes at fluences that are comparable to or higher than those encountered in space applications. Defect and impurity dehydrogenation also contributes significantly to the DD/TID response at fluences typical of realistic space environments. The bias applied during irradiation can affect the DD/TID response strongly. Bias stress before irradiation can lead to enhanced proton-induced degradation of AlGaN/GaN HEMTs. Low-frequency noise measurements and density functional calculations provide insight into defect microstructures and energy levels. GaN-based HEMTs can be quite vulnerable to single-event effects in space. Of particular concern is single-event burnout (SEB). The vulnerabilities of GaN-based devices to SEB at voltages below rated limits and significant device-to-device variations in SEB response lead to significant voltage derating for GaN-based power devices in space systems. Developing an improved understanding of the effects of defects and hydrogen on the radiation response of AlGaN/GaN HEMTs can improve the DD/TID response by reducing threshold-voltage shifts and transconductance degradation. Reducing defect densities may also reduce the variation in SEB response, enabling reliable device operation at higher voltages in future space systems.
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