期刊
IEEE TRANSACTIONS ON ELECTRON DEVICES
卷 69, 期 2, 页码 575-581出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TED.2021.3134929
关键词
Efficiency; heat accumulation; quantum dots; scattering; SiO2 encapsulation
资金
- National Natural Science Foundation of China [51902082, 51672068, 61975051]
- S&T Program of Hebei [216Z0601G]
- Natural Science Foundation of Hebei Province [B2020202049, E2020202083]
The study finds that the thickness of SiO2 shell of QD@SiO2 has a significant impact on the optical performance of QCLEDs, with 20-30 nm SiO2 shell showing optimal efficiency at low power density, while 10-15 nm SiO2 shell is more favorable for reducing thermal quenching at high power density.
SiO2 encapsulated quantum dots (QDs@SiO2) have been widely adopted for fabricating high-performance phosphor-converted light-emitting diodes (QCLEDs). However, the impact of SiO2 thickness on the optical properties of QDs in QCLEDs remains largely unexplored. In this work, we studied the combined effects of light scattering, heat accumulation, and concentration quenching of QD@SiO2 on optical performance of QCLEDs. QDs@SiO2 nanoparticles with SiO2 thickness of 10-60 nm were developed to perform the experimental tests and optical and thermal simulations. Our study reveals that at low power density, QD@SiO2 with 20-30-nm SiO2 shell display optimal efficiency owning to suppressed self-absorption quenching and enhanced light scattering. However, because of heat accumulation inside QDs@SiO2 at high power density, thin SiO2 shell (10-15 nm) is more favorable to reduce thermal quenching and maintain luminous efficiency of QCLEDs. This study provides guidance for the development of appropriate QDs@SiO2 structure to meet application requirements of different QCLED devices.
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据