4.7 Article

Development of All-SiC Absolute Pressure Sensor Based on Sealed Cavity Structure

期刊

IEEE SENSORS JOURNAL
卷 21, 期 24, 页码 27308-27314

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JSEN.2021.3121882

关键词

Silicon carbide; Temperature sensors; Sensors; Pressure sensors; Stress; Substrates; Temperature measurement; All-silicon carbide; piezoresistive pressure sensor; wafer thinning; shallow etching; sealed cavity structure

资金

  1. National Key Research and Development Project of China [2018YFB2002700]

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This study presents a n-type 4H-SiC absolute pressure sensor based on an all-SiC sealed cavity structure, demonstrating the application potential of SiC in high temperature pressure sensors. The sensor showed excellent performance with a sensitivity of 1.56 mV/V/MPa, a nonlinearity of 0.034% FS, and an accuracy of 0.29% FS, paving the way for the development of high temperature pressure sensors.
Silicon carbide has promising potential in high temperature pressure sensors due to its excellent material properties. This paper presents a piezoresistive n-type 4H-SiC absolute pressure sensor based on an all-SiC sealed cavity structure, which provides a new approach for the development of SiC pressure sensors. Firstly, the structural design of the pressure sensor with the measurement range of 10 MPa was conducted through the finite element method. After that, a SiC diaphragm with controllable thickness and high surface quality was achieved through grinding and chemical mechanical polishing process, which indicated that the root mean square surface roughness was 0.168 nm and the relative standard deviation of diaphragm thickness was 0.24%. A patterned SiC substrate with shallow grooves obtained by shallow etching process was directly bonded onto the SiC diaphragm to form the sealed cavity structure. Finally, the performance test of the fabricated sensor at 30 degrees C indicated that the sensitivity was 1.56 mV/V/MPa, the nonlinearity was 0.034% FS, and the accuracy was 0.29% FS. The temperature coefficient of sensitivity exhibited a negative value of -0.134% FS/degrees C at 250 degrees C. Moreover, the maximum temporal drift of zero pressure output at 250 degrees C was only 0.12 mV in 14 hours after several high temperature aging tests. The above research demonstrates the application potential of the proposed SiC sealed cavity structure in all-SiC pressure sensors, which provides a technical foundation for the development of high temperature pressure sensors.

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