4.6 Article

An ISI Scrambling Technique for Dynamic Element Matching Current-Steering DACs

期刊

IEEE JOURNAL OF SOLID-STATE CIRCUITS
卷 57, 期 2, 页码 465-479

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JSSC.2021.3085587

关键词

Digital-to-analog converter (DAC); inter-symbol interference (ISI); dynamic element matching (DEM); current-steering; non-return-to-zero (NRZ)

资金

  1. National Science Foundation [1909678]
  2. Microchip Technology Inc.
  3. Division of Computing and Communication Foundations
  4. Direct For Computer & Info Scie & Enginr [1909678] Funding Source: National Science Foundation

向作者/读者索取更多资源

This study introduces a new technique, ISI scrambling, which, when used in conjunction with DEM technology, ensures that the ISI of a DAC is free from nonlinear distortion. Experimental results show that using the ISI scrambling technique can improve the linearity of DACs and closely match the predicted theoretical results.
The linearity of high-resolution current-steering digital-to-analog converters (DACs) is often limited by inter-symbol interference (ISI). While dynamic element matching (DEM) can be applied to convert a portion of the ISI to uncorrelated noise instead of nonlinear distortion, DEM alone fails to prevent ISI from at least introducing strong second-order nonlinear distortion. This paper addresses this problem by proposing, analyzing, and experimentally demonstrating a low-cost add-on technique, called ISI scrambling, that, in conjunction with DEM, causes a DAC's ISI to be free of nonlinear distortion. The ISI scrambling technique is demonstrated in a 1-GS/s, 14-bit DEM DAC implemented in 90 nm CMOS technology. The DAC's measured linearity is in line with the state-of-the-art and its measured output power spectra closely match those predicted by this paper's theoretical results.

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