4.6 Article

Charge Transport in Deep and Shallow States in a High-Mobility Polymer FET

期刊

IEEE TRANSACTIONS ON ELECTRON DEVICES
卷 63, 期 3, 页码 1254-1259

出版社

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TED.2016.2521663

关键词

Charge transport; drift limited; modeling; polymer FET; subthreshold

资金

  1. Agency for Science, Technology and Research
  2. National Science Foundation (NSF) Nanosystems Engineering Research Center on Nanomanufacturing Systems for Mobile Computing and Mobile Energy Technologies through NSF within the Division of Engineering Education and Centers [1160494]
  3. NSF within the Division of Electrical, Communications and Cyber Systems [1407932]
  4. Research Grant of KwangWoon University
  5. Directorate For Engineering
  6. Div Of Electrical, Commun & Cyber Sys [1407932] Funding Source: National Science Foundation

向作者/读者索取更多资源

Polymer FETs generally have a wide subthreshold regime due to a lot of disorder, mainly originated from domain/grain boundaries. Deep state's charge transport of polymer transistors has not been investigated due to the difficulty in determining the field-effect mobility in the subthreshold region. In this paper, the features of the charge transport in deep and shallow states of polymer transistors will be discussed in detail through an accurate modeling and an analysis of subthreshold behavior in transistors. Charge transport in shallow states can be described by multiple trap and release transport, while hopping transport models, such as variable range hopping or Gaussian disorder-based model, describe well the deeper state's charge transport. In addition, the transition between the conduction regimes is a function of temperature and carrier density.

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