期刊
IEEE TRANSACTIONS ON ELECTRON DEVICES
卷 63, 期 2, 页码 704-709出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TED.2015.2508672
关键词
Amorphous selenium (a-Se) detector; carrier trapping and detrapping; lag signal; photocurrent; residual current
The photocurrent and the lag signals in amorphous selenium (a-Se) detectors have been characterized by measuring the optical and residual currents under varying light intensity, applied electric field, and temperature. A mathematical model for the transient photocurrent and residual current in a-Se detectors has also been developed. The photocurrent and the lag signal increase rapidly with the applied field because of enhancement of the quantum yield. The residual current increases with increasing the field, ambient temperature, and light intensity. The lag signal gets saturated with increasing the intensity. The percentage lag signal decreases with increasing the field and light intensity.
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