Thin film annealing: A crucial parameter in controlling electrode properties of solid oxide fuel cells

The least surface electrode resistance is a key in maturing low-temperature solid oxide fuel cells (SOFCs). The current article addresses the effect of crystallinity on electrode kinetics of La0.6Sr0.4Co0.2Fe0.8O3-delta using annealing in 650-1000 degrees C range. Increased polaron activity and hence conductivity due to in-situ crystallization in 273-380 degrees C range, with highest conductivity of 9.62 Scm(-1), is evidenced the strain induced in low temperature annealed electrodes were higher sourcing the driving force for diffusion of carriers in thin films. To understand this effect comprehensively, the thin film surfaces were studied for degree of crystallinity, elemental atomic distribution, in- and cross-plane electrical performances.

Automated summary

The study investigates the effect of crystallinity on electrode kinetics of La0.6Sr0.4Co0.2Fe0.8O3-delta, revealing that in-situ crystallization at lower temperatures during annealing can enhance the electrode conductivity and drive the diffusion of carriers in thin films.