期刊
IEEE JOURNAL OF SOLID-STATE CIRCUITS
卷 51, 期 2, 页码 378-390出版社
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/JSSC.2015.2501424
关键词
Analog design-for-testability (DFT); analog-to-digital converter (ADC); high-volume manufacturing (HVM); high-volume testing; sigma-delta modulation
On complex system-on-chips (SOCs), a compact on-die analog-to-digital converter (ADC) is required in high-volume testing, in order to reduce the test time and improve the test coverage of on-die analog intellectual properties (IPs). This paper presents a compact first-order Sigma Delta modulator for on-die voltage measurements in such applications. The primary design focus is to achieve a highly compact area so that many instances can be integrated to cover the testing of multiple analog IPs on a single chip die. The proposed modulator deploys an inverter-based architecture which enables the aggressive area reduction. There are two new additional enhancements: 1) hardware dithering to minimize the limit-cycling effect and 2) time-multiplexed pseudodifferential operation for common mode rejection. The modulator exhibits a figure of merit (FOM) of 554.7 fJ/conv-step, in spite of the compact area of only 0.00023 mm(2).
作者
我是这篇论文的作者
点击您的名字以认领此论文并将其添加到您的个人资料中。
推荐
暂无数据