期刊
APPLIED SPECTROSCOPY
卷 76, 期 5, 页码 590-598出版社
SAGE PUBLICATIONS INC
DOI: 10.1177/00037028211068078
关键词
Optical constants; extinction coefficient; refractive index; transmittance; analytical modeling; calcium fluoride; silicon
资金
- French National Research Agency [ANR-19-CE09-0013]
- Le Quy Don Technical University [20.1.028]
- Agence Nationale de la Recherche (ANR) [ANR-19-CE09-0013] Funding Source: Agence Nationale de la Recherche (ANR)
In this paper, a new inverse analytical method is proposed to extract the optical parameters of a slab without the need for numerical iteration processes. The high accuracy of this method is evaluated by determining the optical parameters of CaF2 and Si substrates in the IR spectral range of 4-8 μm.
To date, determining with high accuracy the optical parameters (extinction coefficient k and refractive index n) of a slab from the sole transmittance data requires an inverse method based on numerical iteration procedures. In this paper, we propose a new inverse analytical method of extracting (k, n) without numerical iterative processes. The high accuracy of this new inverse method is assessed, and as an application example, the optical parameters of CaF2 and Si substrates are determined in the IR spectral range of 4-8 mu m.
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