An 11b 450 MS/s Three-Way Time-Interleaved Subranging Pipelined-SAR ADC in 65 nm CMOS

This paper presents an 11 bit 450 MS/s three-way time-interleaved (TI) subranging pipelined-successive approximation register (SAR) analog-to-digital converter (ADC). The proposed hybrid architecture combines the design benefits of different ADC structures to achieve a high conversion rate and accuracy with good power efficiency. The design employs multiple offset calibration schemes to compensate the offset mismatches at each stage. The solutions require less calibration efforts, thus allowing the ADC to achieve a compact area. Furthermore, a dynamic SAR controller embedded with error-decision-correction (EDC) logic is proposed to reduce large transition error. Measurement results on a 65 nm CMOS prototype operated at 450 MS/s and 1.2 V supply show 7.4mWtotal power consumption with a peak signal-to-noise distortion ratio (SNDR) of 60.8 dB and an FOM of 32 fJ/conv. step at Nyquist.