4.7 Article

Simultaneous Passivation of the SnO2/Perovskite Interface and Perovskite Absorber Layer in Perovskite Solar Cells Using KF Surface Treatment

期刊

ACS APPLIED ENERGY MATERIALS
卷 4, 期 10, 页码 10921-10930

出版社

AMER CHEMICAL SOC
DOI: 10.1021/acsaem.1c01893

关键词

perovskite solar cells; non-radiative recombination; SnO2/perovskite interface; defect passivation; KF surface modification

资金

  1. National Natural Science Foundation of China [61604131, 62025403, 61704154, 11804300]
  2. Natural Science Foundation of Zhejiang Province [LY19F040009, LQ18A040005]
  3. Fundamental Research Funds of Zhejiang Sci-Tech University [2020Q039]
  4. National Undergraduate Training Program for Innovation [202010338031]
  5. Open Project of Key laboratory of Solar Energy Utilization & Energy Saving Technology of Zhejiang Province [ZJS-OP-2020-07]

向作者/读者索取更多资源

By modifying the surface of SnO2 with KF, defects at both the SnO2/perovskite interface and within bulk perovskite films were effectively passivated, leading to improved crystallinity and morphology of perovskite films, enhanced carrier transport capability, and a significant increase in PCE for PSCs.
Recently, SnO2 has been recognized as a promising electron transport layer (ETL) for perovskite solar cells (PSCs) due to its outstanding optoelectronic properties and low-temperature fabricating process. However, the detrimental defects formed at the SnO2/perovskite interface and within bulk perovskite films cause severe non-radiative recombination, limiting the further improvement of power conversion efficiencies (PCEs). Herein, we have demonstrated a facile surface treatment on SnO2 through KF modification to passivate defects at both regions simultaneously. F- ions reduce the detrimental hydroxyl group defects on the SnO2 surface effectively, resulting in improved crystallinity of perovskite films with a more favorable morphology. Meanwhile, a preferred energy level alignment between SnO2 and MAPbI(3) films is obtained, improving the carrier transport capability. Moreover, K+ ions can diffuse into the MAPbI(3) film, passivating the grain boundaries and intrinsic I- vacancy defects. Consequently, a significant increase in PCE from 18.47 to 20.33% is achieved for a MAPbI(3) PSC based on a SnO2/KF ETL, with negligible hysteresis and improved stability.

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