期刊
ELECTRONICS
卷 10, 期 17, 页码 -出版社
MDPI
DOI: 10.3390/electronics10172096
关键词
electromagnetic interference (EMI); electromagnetic compatibility (EMC); operational amplifier (Opamp); analog integrated circuits; acquisition front-end (AFE); digital processing; sensor readout; EMI-induced offset; EMI distortion
This paper addresses the susceptibility of an analog signal acquisition front-end (AFE) to Electromagnetic Interference (EMI) in opamp-based pre-conditioning amplifiers. It discusses the possibility to correct EMI-induced errors in the digital domain through post-processing of acquired digital waveforms, and demonstrates this method experimentally for the first time. Experimental characterization in the presence of continuous wave and amplitude modulated EMI shows the superior immunity to EMI of the proposed AFE and the robustness of the approach.
In this paper, the susceptibility to Electromagnetic Interference (EMI) of an analog signal acquisition front-end (AFE) due to EMI distortion in opamp-based pre-conditioning amplifiers is addressed. More specifically, the possibility to correct EMI-induced errors in the digital domain by post-processing the acquired digital waveforms is discussed and experimentally demonstrated for the first time with reference to an AFE based on EMI-sensitive, off-the-shelf operational amplifiers mounted on a specific EMI test PCB. Extensive experimental characterization in the presence of continuous wave and amplitude modulated EMI reveals the superior immunity to EMI of the proposed AFE and the robustness of the approach.
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