Evaluation of the Effective Microstructure Parameter of the Microwave Emission Model of Layered Snowpack for Multiple-Layer Snow

Natural snow, one of the most important components of the cryosphere, is fundamentally a layered medium. In forward simulation and retrieval, a single-layer effective microstructure parameter is widely used to represent the emission of multiple-layer snowpacks. However, in most cases, this parameter is fitted instead of calculated based on a physical theory. The uncertainty under different frequencies, polarizations, and snow conditions is uncertain. In this study, we explored different methods to reduce the layered snow properties to a set of single-layer values that can reproduce the same brightness temperature (T-B) signal. A validated microwave emission model of layered snowpack (MEMLS) was used as the modelling tool. Multiple-layer snow T-B from the snow's surface was compared with the bulk T-B of single-layer snow. The methods were tested using snow profile samples from the locally validated and global snow process model simulations, which follow the natural snow's characteristics. The results showed that there are two factors that play critical roles in the stability of the bulk T-B error, the single-layer effective microstructure parameter, and the reflectivity at the air-snow and snow-soil boundaries. It is important to use the same boundary reflectivity as the multiple-layer snow case calculated using the snow density at the topmost and bottommost layers instead of the average density. Afterwards, a mass-weighted average snow microstructure parameter can be used to calculate the volume scattering coefficient at 10.65 to 23.8 GHz. At 36.5 and 89 GHz, the effective microstructure parameter needs to be retrieved based on the product of the snow layer transmissivity. For thick snow, a cut-off threshold of 1/e is suggested to be used to include only the surface layers within the microwave penetration depth. The optimal method provides a root mean squared error of bulk T-B of less than 5 K at 10.65 to 36.5 GHz and less than 10 K at 89 GHz for snow depths up to 130 cm.

Automated summary

This study explores different methods to reduce layered snow properties to single-layer values that can reproduce the same brightness temperature signal, using a validated microwave emission model. The results show that the single-layer effective microstructure parameter and reflectivity at boundaries play critical roles in stability of the bulk brightness temperature error.