期刊
NATURE COMMUNICATIONS
卷 12, 期 1, 页码 -出版社
NATURE PORTFOLIO
DOI: 10.1038/s41467-021-25648-7
关键词
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资金
- U.S. Department of the Defense, Defense Threat Reduction Agency [HDTRA1-19-1-0024]
- U.S. Department of Energy/National Nuclear Security Administration [DE-NA0003921]
- U.S. Department of Energy, Office of Science by Los Alamos National Laboratory [89233218CNA000001]
- Sandia National Laboratory [DE-NA-0003525]
In this study, a new statistical model is proposed to determine the detection limit of X-ray detectors by measuring dark current and photocurrent. The authors found that in addition to material quality, device architecture and working mode also have a significant influence on sensitivity and detection limit.
X-ray detection limit and sensitivity are important figure of merits for perovskite X-ray detectors, but literatures lack a valid mathematic expression for determining the lower limit of detection for a perovskite X-ray detector. In this work, we present a thorough analysis and new method for X-ray detection limit determination based on a statistical model that correlates the dark current and the X-ray induced photocurrent with the detection limit. The detection limit can be calculated through the measurement of dark current and sensitivity with an easy-to-follow practice. Alternatively, the detection limit may also be obtained by the measurement of dark current and photocurrent when repeatedly lowering the X-ray dose rate. While the material quality is critical, we show that the device architecture and working mode also have a significant influence on the sensitivity and the detection limit. Our work establishes a fair comparison metrics for material and detector development. The limit of X-ray detection is an important figure of merit for X-ray detectors, yet the suitability of method adopted from Currie's 1968 paper and the following international standard is in doubt. Here, the authors propose a statistical model that correlates dark current and photo-current, show how it can be used to determine detection limit.
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