期刊
REVIEW OF SCIENTIFIC INSTRUMENTS
卷 92, 期 6, 页码 -出版社
AMER INST PHYSICS
DOI: 10.1063/5.0024875
关键词
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资金
- Army Research Office [W911NF-17-1-0051]
- Advanced Research Projects Agency-Energy (ARPA-E) [DE-AR0000808, DEAR0000493]
- U.S. Department of Energy [DEAC36-08GO28308]
- Alliance for Sustainable Energy, LLC
- Office of Energy Efficiency and Renewable Energy (EERE) under the Hydrogen and Fuel Cell Technologies Office (HFCO), HydroGEN Energy Materials Network (EMN) consortium
An instrument for spatially resolved measurements of electrochemical impedance under various temperatures and gas environments was demonstrated. Automated measurements controlled by a custom LabVIEW program include probe and sample motion, temperature ramps, and potentiostat functions. The method was shown to proficiently map property trends in materials through measurements on a compositionally graded array of electrocatalytically active thin film microelectrodes.
We demonstrate an instrument for spatially resolved measurements (mapping) of electrochemical impedance under various temperatures and gas environments. Automated measurements are controlled by a custom LabVIEW program, which manages probe motion, sample motion, temperature ramps, and potentiostat functions. Sample and probe positioning is provided by stepper motors. Dry or hydrated atmospheres (air or nitrogen) are available. The configurable heater reaches temperatures up to 500 degrees C, although the temperature at the sample surface is moderated by the gas flow rate. The local gas environment is controlled by directing flow toward the sample via a glass enclosure that surrounds the gold wire probe. Software and hardware selection and design are discussed. Reproducibility and accuracy are quantified on a Ba(Zr,Y)O3-delta proton-conducting electrolyte thin film synthesized by pulsed laser deposition. The mapping feature of the instrument is demonstrated on a compositionally graded array of electrocatalytically active Ba(Co,Fe,Zr,Y)O3-delta thin film microelectrodes. The resulting data indicate that this method proficiently maps property trends in these materials, thus demonstrating the reliability and usefulness of this method for investigating electrochemically active thin films.
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