Spatiospectral characterization of ultrafast pulse-beams by multiplexed broadband ptychography

Ultrafast pulse-beam characterization is critical for diverse scientific and industrial applications from micromachining to generating the highest intensity laser pulses. The four-dimensional structure of a pulse-beam, (E) over tilde (x,y , z, omega), can be fully characterized by coupling spatiospectral metrology with spectral phase measurement. When temporal pulse dynamics are not of primary interest, spatiospectral characterization of a pulse-beam provides crucial information even without spectral phase. Here we demonstrate spatiospectral characterization of pulse-beams via multiplexed broadband ptychography. The complex spatial profiles of multiple spectral components, (E) over tilde (x, y, omega), from modelocked Ti:sapphire and from extreme ultra-violet pulse-beams are reconstructed with minimum intervening optics and no refocusing. Critically, our technique does not require spectral filters, interferometers, or reference pulses. (C) 2021 Optical Society of America under the terms of the OSA Open Access Publishing Agreement

Automated summary

In this study, the spatial-spectral characteristics of pulse-beams are demonstrated using multiplexed broadband ptychography, without the need for spectral filters, interferometers, or reference pulses.