Investigation on tight focus of polarized beams through cylindrical dielectric interface

In this work, the polarized beams tightly focused through a cylindrical refractive-indices discontinuous dielectric interface was numerically investigated. The corresponding focal pattern calculation formula was deduced base on vectoral diffraction integration theory for the first time. The patterns through the cylindrical dielectric interface with different radii were revealed by numerical calculating and discussed in detail. In addition, the aberration factor of the integration formula was found out, and the phase compensation maps were successfully carried out for focal patterns correcting. The findings will be helpful to improve the spatial resolution of advanced optical microscope in probing samples encapsulated by micro pipes.

Automated summary

In this study, the polarized beams tightly focused through a cylindrical refractive-indices discontinuous dielectric interface were numerically investigated. The corresponding focal pattern calculation formula was deduced based on vectoral diffraction integration theory for the first time. The findings of aberration factor and phase compensation maps will improve the spatial resolution of advanced optical microscope.