相关参考文献
注意：仅列出部分参考文献，下载原文获取全部文献信息。Comprehensive Elucidation of Grain Boundary Behavior in All-Inorganic Halide Perovskites by Scanning Probe Microscopy
Yanyan Wang et al.
ADVANCED MATERIALS INTERFACES (2020)
Scanning Probe Microscopy of Topological Structure Induced Electronic States of Graphene
Shichao Li et al.
SMALL METHODS (2020)
Multifunctional Boron-Doped Diamond Colloidal AFM Probes
Sven Daboss et al.
SMALL (2019)
Graphene-Graphene Interactions: Friction, Superlubricity, and Exfoliation
Robert C. Sinclair et al.
ADVANCED MATERIALS (2018)
Interlayer Friction and Superlubricity in Single-Crystalline Contact Enabled by Two-Dimensional Flake-Wrapped Atomic Force Microscope Tips
Yanmin Liu et al.
ACS NANO (2018)
Superlubricity of Graphite Sliding against Graphene Nanoflake under Ultrahigh Contact Pressure
Jinjin Li et al.
ADVANCED SCIENCE (2018)
Imaging modes of atomic force microscopy for application in molecular and cell biology
Yves F. Dufrene et al.
NATURE NANOTECHNOLOGY (2017)
Sharp-Tip Silver Nanowires Mounted on Cantilevers for High-Aspect Ratio High-Resolution Imaging
Xuezhi Ma et al.
NANO LETTERS (2016)
Moving graphene devices from lab to market: advanced graphene-coated nanoprobes
Fei Hui et al.
NANOSCALE (2016)
Carbon nanotube modified probes for stable and high sensitivity conductive atomic force microscopy
Ashley D. Slattery et al.
NANOTECHNOLOGY (2016)
Customized atomic force microscopy probe by focused-ion-beam-assisted tip transfer
Andrew Wang et al.
APPLIED PHYSICS LETTERS (2014)
Wafer scale tilt-compensated silicon nanowire atomic force microscopy probes for high aspect ratio geometries
Brian A. Bryce et al.
JOURNAL OF MICROMECHANICS AND MICROENGINEERING (2014)
Wear Characteristics of Atomic Force Microscopy Tips: A Reivew
Koo-Hyun Chung
INTERNATIONAL JOURNAL OF PRECISION ENGINEERING AND MANUFACTURING (2014)
Graphene MEMS: AFM Probe Performance Improvement
Cristina Martin-Olmos et al.
ACS NANO (2013)
Graphene-Coated Atomic Force Microscope Tips for Reliable Nanoscale Electrical Characterization
M. Lanza et al.
ADVANCED MATERIALS (2013)
Ultra-high aspect ratio replaceable AFM tips using deformation-suppressed focused ion beam milling
Alexey Savenko et al.
NANOTECHNOLOGY (2013)
Silicon nanowire atomic force microscopy probes for high aspect ratio geometries
Brian A. Bryce et al.
APPLIED PHYSICS LETTERS (2012)
Single-molecule chemistry and physics explored by low-temperature scanning probe microscopy
Ingmar Swart et al.
CHEMICAL COMMUNICATIONS (2011)
Micrometer-Scale Ballistic Transport in Encapsulated Graphene at Room Temperature
Alexander S. Mayorov et al.
NANO LETTERS (2011)
Method for Characterizing Nanoscale Wear of Atomic Force Microscope Tips
Jingjing Liu et al.
ACS NANO (2010)
Heterogeneous Catalysis of a Copper-Coated Atomic Force Microscopy Tip for Direct-Write Click Chemistry
Walter F. Paxton et al.
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY (2009)
Superior thermal conductivity of single-layer graphene
Alexander A. Balandin et al.
NANO LETTERS (2008)
Fine structure constant defines visual transparency of graphene
R. R. Nair et al.
SCIENCE (2008)
Measurement of the elastic properties and intrinsic strength of monolayer graphene
Changgu Lee et al.
SCIENCE (2008)
Experimental observation of the quantum Hall effect and Berry's phase in graphene
YB Zhang et al.
NATURE (2005)
An improved wedge calibration method for lateral force in atomic force microscopy
M Varenberg et al.
REVIEW OF SCIENTIFIC INSTRUMENTS (2003)
Scanning nanoscale multiprobes for conductivity measurements
P Boggild et al.
REVIEW OF SCIENTIFIC INSTRUMENTS (2000)
分享论文
